MicroSense, LLC, A KLA Company
Lowell, United States (US) · Electronics
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Last verified
May 2026
#wafer measurement systems
#vibrating sample magnetometers
#capacitive sensors
#magnetic property measurement
#non-contact position sensors
#precision displacement sensors
#wafer thickness and flatness measurement
#wafer metrology
#mram wafer measurement
Overview
MicroSense, LLC, A KLA Company is a leading provider of precision wafer measurement systems, based in Lowell, Massachusetts. We specialize in delivering state-of-the-art solutions for the semiconductor industry, including wafer flatness, MRAM, thin film stress, and back grind thickness measurement. Our technology empowers manufacturers to optimize their processes and achieve superior product quality. As part of KLA Corporation, we leverage decades of experience and a commitment to innovation to support our customers’ success. We offer extensive business experience, financial strength, world-wide support, and technical leadership.
MicroSense’s core offerings focus on advanced metrology, providing critical data for wafer processing and ensuring consistent performance. We cater to a diverse range of applications, from MRAM development to thin film stress characterization. Our solutions are designed to enhance process control and improve overall manufacturing efficiency.
What sets MicroSense apart is our dedication to providing highly accurate and reliable measurement systems, combined with unparalleled customer support. We are committed to continuous improvement and innovation, driving advancements in wafer metrology technology. Our strong partnership with KLA Corporation allows us to deliver comprehensive solutions and exceptional value to our clients.
Contact Details
Lowell, United States (US), 205 Industrial Ave
+1
Founded
2009
Company Type
Private Limited Company
Employees
30-50
Keywords
#wafer measurement systems
#vibrating sample magnetometers
#capacitive sensors
#magnetic property measurement
#non-contact position sensors
#precision displacement sensors
#wafer thickness and flatness measurement
#wafer metrology
#mram wafer measurement
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