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Nearfield Instruments

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Overview

Revolutionary high throughput scanning probe microscopy systems for Semiconductor metrology

Description

Nearfield Instruments brings together the most creative minds in science and technology to develop, produce and market revolutionary high throughput scanning probe microscopy systems, enabling atom-scale resolution 3D metrology at industry-level throughput. We design, develop, integrate, market and service these advanced metrology machines, which enable our customers – the world’s leading chipmakers – to increase the production yields, and thus, functionality of their microchips. In this way NFI contributes to the development of smaller, more powerful consumer electronics.

Founded 2016

100-150

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Contact details

roland.vanvliet@nearfieldinstruments.com

Rotterdam, The Netherlands