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MRAM Wafer Metrology | MicroSense, LLC, A KLA Company

Product description

Systems for characterizing the magnetic properties of multi-layer wafers used in the development and manufacturing of perpendicular MRAM. Provides detailed insights into magnetic domain alignment and stability.

MicroSense, LLC, A KLA Company Logo

MicroSense, LLC, A KLA Company

Lowell, United States (US)


Price: N/A