Product
Harmonic Series Metrology System
SEMICONDUCTOR
byFemtoMetrix, Inc.
United States (US)
ABOUT THE PRODUCT
Our flagship Harmonic series metrology systems enable fabs to improve yield by detecting Non-Visual Defects (NVD) optically. These include yield-killing non-uniformities that cannot be seen by other in-line tools.
Information is owner-confirmed
Last updated 9 hours ago
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